Method for the automatic calibration-only, or calibration...

Details Method for the automatic calibration-only, or calibration... Method for the automatic calibration-only, or calibration...

2005-09-13

2005-09-13

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Sensor or transducer

C702S091000, C702S094000, C702S152000, C702S167000, C356S601000

Reexamination Certificate

active

06944564

ABSTRACT:
The present invention relates to a method for calibrating a non-contact probe on a localizer. The present invention further relates to a method for the simultaneous calibration and qualification of a non-contact probe on a localizer. Both methods do not require user intervention, and use a single artifact.

REFERENCES:
patent: 6493956 (2002-12-01), Matsuda
patent: 6583869 (2003-06-01), Sheridan
patent: 2004/0024311 (2004-02-01), Quaid
patent: 2004/0034282 (2004-02-01), Quaid
patent: 2000180103 (2000-06-01), None
patent: WO 0039522 (2000-07-01), None
patent: WO 0041141 (2000-07-01), None
patent: WO 0107866 (2001-02-01), None
European Patent Office Search Report, Application No. EP 03447101, Sep. 16, 2003.

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