Method for the analysis of impurity contents in silicon dioxide

Chemistry: analytical and immunological testing – Including sample preparation – Digestion or removing interfering materials

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

436 83, 436127, 436149, 436150, 436151, 436111, 438 14, 134 2, 134 3, 134 10, 134 13, 134 26, 134 28, 134 29, G01N 100

Patent

active

058770275

ABSTRACT:
An analytical method for the quantitative determination of the impurities in silicon dioxide by which trace amounts of hardly soluble impurities contained in silicon dioxide can be reliably decomposed and converted into a solution so that the contents of all of the impurities contained in silicon dioxide or, in particular, zirconium in a natural quartz powder can be accurately determined. Silicon dioxide is decomposed with hydrofluoric acid or an acid mixture of hydrofluoric acid and another inorganic acid to give a decomposition solution which is, as such or after admixture with another inorganic acid, subjected to evaporation to dryness and the residue is heated to cause fusion with addition of a salt or hydroxide of an alkali metal followed by dissolution of the salt or hydroxide of an alkali metal with pure water or with an aqueous solution of an inorganic acid to give an aqueous solution which is subjected to quantitative analysis of the impurities therein.

REFERENCES:
patent: 5063179 (1991-11-01), Menashi et al.
Loon et al "The Determination of Yttrium, Europium, Terbium, Dysprosium, Holmium, Erbium, Tholium, Ytterbium, and Lutetium in Minerals by Atomic-absorption spectrophotomery" Analyst, Jan. 1971, vol. 96, pp. 47-50.
Tong S et al Determination of trace impurities at the pph level in fused silica by spark source mass spectrometry Anal. Chem. Acta (1976) 84 (2) 327-33.
Sulcek et al. "Analytical fast methods for determination of metals and inorganic raw materials XVII. Separation of zirconium or silica gel and its determination in silicates" Collect. Czech. Chem. Common. (1969), 34 (6) 1720-30.
Kiriyama, et al T. Anim-exchange separation and spectro photomatric determination of zirconium and uranium in silicate rocks w/arseno II Nippon Kagaku Katshi (1979) (11) 1609-11. Abstract only.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for the analysis of impurity contents in silicon dioxide does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the analysis of impurity contents in silicon dioxide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the analysis of impurity contents in silicon dioxide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-422157

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.