Method for the adjustment of a device under test

Details Method for the adjustment of a device under test Method for the adjustment of a device under test

2009-05-06

2011-11-01

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750010, C324S750300

Reexamination Certificate

active

08049513

ABSTRACT:
A method for adjusting an output signal produced by a device under test from an input variable by: a) positioning the device under test at a first test device with a physical disturbance variable and a known input variable value, b) acquiring at least one measured value for the output signal, c) changing the adjustment state, d) acquiring a further measured value for the output signal, e) positioning the device under test at a further test device having a further disturbance variable value and the input variable value, f) acquiring a further measured value for the output signal, g) changing the adjustment state, h) acquiring a further measured value for the output signal, i) comparing the measured values acquired at the test devices for each adjustment state and determining a first adjustment state in which the correlation between the measured values is larger than in a second adjustment state.

REFERENCES:
patent: 6154872 (2000-11-01), Jones
patent: 6749335 (2004-06-01), Gauthier et al.
patent: 7242198 (2007-07-01), Schneider et al.
patent: 10154495 (2003-05-01), None
Gert van der Horn et al., “Integrated Smart Sensors Design and Calibration,” Micronas, 1997, 3.1.4 and 3.2.

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