Method for texturing surfaces of silicon wafers

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S745000, C438S021000, C438S003000, C216S013000, C216S083000, C216S087000, C216S096000, C216S099000, C257SE21219, C257SE21223

Reexamination Certificate

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10555141

ABSTRACT:
A method for texturing surfaces of silicon wafers comprising the steps of dipping the silicon wafers in an etching solution of water, concentrated hydrofluoric acid and concentrated nitric acid and setting a temperature for the etching solution. The etching solution comprises, in percent, 20% to 55% water, 10% to 40% concentrated hydrofluoric acid and 20% to 60% concentrated nitric acid and the temperature of the etching solution is between 0 and 15 degrees Celsius.

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patent: 5681398 (1997-10-01), Muraoka
patent: 6309467 (2001-10-01), Wochner et al.
patent: 6340640 (2002-01-01), Nishimoto et al.
patent: 2002/0187583 (2002-12-01), Chang et al.
patent: 199 62 136 (2001-06-01), None
patent: 05291215 (1993-11-01), None

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