Method for testing the electrical parameters of inputs and outpu

Details Method for testing the electrical parameters of inputs and outpu Method for testing the electrical parameters of inputs and outpu

1992-10-02

1995-10-10

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324763, G01R 1512

Patent

active

054573815

ABSTRACT:
Test circuitry implemented in an integrated circuit having a plurality of I/O circuits for testing of the electrical parameters of the I/O circuits without probing the contact pads associated therewith. The test circuitry includes a test drive bus, a test drive pad connected to the test drive bus, a test observe bus, a test observe pad connected to said test observe bus. Associated with each I/O circuit are a test drive transmission gate connected between the associated I/O pad and the test drive bus, and a test observe transmission gate connected between the associated I/O pad and the test observe bus. The transmission gates for each pad are controlled in parallel via a scan control register, and are connected by separate conductive traces to the I/O pad. If an I/O includes an input buffer, the input to the input buffer is connected to the I/O pad via the separate conductive trace to the test drive transmission gate; and if an I/O has an output driver, the output to the output driver is connected to the I/O pad via the separate conductive trace for the test observe transmission gate.

REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4782283 (1988-11-01), Zasio
patent: 4837765 (1989-06-01), Suzuki
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 4931722 (1990-06-01), Stoica

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