Method for testing the authenticity of a data carrier having an

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364488, G01R 3128

Patent

active

058187383

DESCRIPTION:

BRIEF SUMMARY
BACKGROUND OF THE INVENTION

The present invention relates to a method for testing the authenticity of a data storage carrier having at least one integrated circuit with memory and logic means as well as elements for inputting and outputting data.
It has been known for some time to test the authenticity of data storage carriers, such as tokens of value negotiable instruments, or similar monetary products using an individual physical and machine-detectable property characteristic of each token.
One obtains a high security standard if the individual property or characteristic is a feature that can only be imitated with great technical effort. Such an individual physical property may, for example, be a quality that arises randomly during production due to manufacturing variations.
In this connection, German laid-open print no. 24 58 705 proposes measuring the color and print properties, the thickness of the applied ink, paper dimensions or paper properties as individual quantities of a token of value or bank note. The automatically, measured individual characteristic may be stored on the token in an encrypted form. During authenticity testing the individual quantity is measured again and tested for identity with the reference value determined in the first test and stored on the token.
According to another proposal (EP 112 461) it is also known to measure as an individual characteristic variances due to manufacturing tolerances. The specific property of a microwave antenna is stored in the identity card in this known proposal to allow for contactless operation of the integrated circuit. Electrically measurable quantities that are measured are, for example, the reflection properties specific to each antenna. The measured quantity is encrypted via a secret algorithm into a code number that is deposited as a reference value in the memory of the integrated circuit for subsequent authenticity testing.
In the proposed method, only a feature of a peripheral unit, the microwave antenna, is measured for determining the authenticity of a data carrier having an integrated circuit. The integrated circuit itself is not protected from manipulation via this feature. Above all, the method proposed here can only be used for those identity cards in which the dialog between the card and the test unit takes place in contactless fashion via appropriate coupling elements such as microwave antennas.
The majority of identity cards having integrated circuits that are used in practice today, and presumably also in the foreseeable future, are operated in contacting fashion using conventional galvanic contacting. This contacting method is definitely much easier to realize technically and less expensive.


SUMMARY OF THE INVENTION

The unsolved problem on which the invention is based is to propose a method for testing the authenticity of data storage carriers having integrated circuits which is more reliable when it comes to recognizing manipulations and can be used for virtually all data carriers having integrated circuits.
This problem is solved according to the claimed invention.
The invention is based on the surprising finding that, in spite of the perfectionism and constantly increasing miniaturization involved in IC production and the constantly improved quality and purity of the basic materials, the integrated circuit itself still allows for the possibility of detecting physical characteristics in terms of its "fine structure" which distinguish it clearly from circuits of the same type and with the same function. Thus, the circuit itself makes it possible to obtain individual data characteristic of every single circuit which meet the general conditions for use as authenticity features.
When selecting physical property to be used for authenticity testing, one must make sure the property has sufficient "individuality" in the "fine structure" of each chip due to the tolerances of production technology, the material, etc., can be detected by measurement technology with reasonable effort, is independent or can be isolated from external

REFERENCES:
patent: 4454577 (1984-06-01), Costantini et al.
patent: 4523087 (1985-06-01), Benton
patent: 4529870 (1985-07-01), Chaum
patent: 4538268 (1985-08-01), Pham Van Cang
patent: 4582985 (1986-04-01), Lofberg
patent: 4630224 (1986-12-01), Sollman
patent: 4783801 (1988-11-01), Kaule
"A Behavioural Test Method for Microprocessors and Complex Circuits" by C Bellon et al, IEE European Conference on electronic Design Automation 26-30 Mar. 1984, pp. 79-82.
"Intelligent Assistance for Test Program Generation" by C. Bellon et al, IEE Europen Conference on Electronic Design Automation, 26-30 Mar. 1984, pp. 166-170.
"Optical Interconnections for VLSI Systems" by Goodman et al., IEEE 1984, Proceedings of IEEE, vol. 72, No. 7, Jul. 1984, pp. 850-866.
"Optical Imaging Applied to Microelectronic Chip-to Chip Interconnections" by Kostuk et al., Applied Optics, vol. 24, No. 17, Sep. 1985, pp. 2851-2858.

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