Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-12
2009-06-09
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07545158
ABSTRACT:
A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time.
REFERENCES:
patent: 6515470 (2003-02-01), Suzuki et al.
patent: 6522777 (2003-02-01), Paulsen et al.
patent: 7095242 (2006-08-01), Bjork
Chen Ching-Too
Costello Michael Peter
Hopkins James E.
Tsai Herbert
Campbell Shaun
Chroma ATE Inc.
Lenkszus Donald J.
Nguyen Ha Tran T
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