Method for testing switch matrices

Details Method for testing switch matrices Method for testing switch matrices

1994-05-20

1996-01-23

Regan, Maura K.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324538, 324 731, G01R 3102

Patent

active

054867665

ABSTRACT:
A testing method for connecting a first group of input conductors to output conductors in which the number of switching devices connected to each output conductor at connections with the group of input conductors are summed individually, the output conductor having the least number of switching devices at these intersections is chosen, and the switching devices are summed for each of the group of input conductors having a switching device at an intersection with the chosen output conductor and the input conductor having the least number of switching devices is selected. A switching device at the intersection of this first selected input conductor and the first selected output conductor is chosen for closure to provide the first connection in the output combination desired. The process is repeated until all of the connections are chosen or one fails.

REFERENCES:
patent: 4587481 (1986-05-01), Lischke et al.
patent: 5057775 (1991-10-01), Hall
patent: 5065090 (1991-11-01), Gheewala et al.
patent: 5083083 (1992-01-01), El-Ayat et al.
patent: 5202624 (1993-04-01), Gheewala et al.
patent: 5309091 (1994-05-01), El-Ayat et al.

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