Method for testing semiconductor integrated circuits soldered to

Details Method for testing semiconductor integrated circuits soldered to Method for testing semiconductor integrated circuits soldered to

1992-03-23

1994-01-18

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324158T, 371 151, G01R 3100

Patent

active

052802370

ABSTRACT:
A method for testing a semiconductor integrated circuit soldered into a printed circuit board makes use of the existence of parasitic transistors which occur on integrated circuits having diodes formed thereon. The method includes applying a voltage across the pins of the integrated circuit to be tested, measuring currents resulting from the voltage applied across the pins of the integrated circuit, connecting a transistor tester to selected pins of the integrated circuit, and determining typical control or switching characteristics of a parasitic transistor (1T, 2T) of the semiconducting integrated circuit (IC1, IC2). A commercial transistor tester is usable to perform the method.

REFERENCES:
patent: 4035826 (1977-07-01), Morton et al.
patent: 4779041 (1988-10-01), Williamson, Jr.
patent: 4779043 (1988-10-01), Williamson, Jr.
patent: 4817012 (1989-03-01), Cali' 324158 T

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