Method for testing semiconductor integrated circuit device, volt

Details Method for testing semiconductor integrated circuit device, volt Method for testing semiconductor integrated circuit device, volt

1993-04-27

1994-09-20

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3128

Patent

active

053492900

ABSTRACT:
In a voltage drop power supply circuit for a semiconductor integrated circuit device, a first unit generates a constant internal power supply voltage from an external power supply voltage in accordance with a first characteristic line defining a relationship between the external power supply voltage and the internal power supply voltage, and applies the constant internal power supply voltage to internal circuits of the semiconductor integrated circuit device. A second unit generates a burn-in voltage from the external power supply voltage having a level higher than that used in the normal operation in accordance with a second characteristic line defining a relationship between the external power supply voltage and the internal power supply line, and applies the burn-in voltage to the internal circuits when a burn-in test is carried out for the semiconductor integrated circuit device. The second characteristic line crosses the first characteristic line at an intermediate point between lower and upper limit voltages defined by the first characteristic line. The burn-in voltage is greater than the internal power supply voltage used in the normal operation.

REFERENCES:
patent: 5030905 (1991-07-01), Figal
patent: 5083083 (1992-01-01), El-Ayat et al.
patent: 5097206 (1992-03-01), Perner
patent: 5111136 (1992-05-01), Kawashima

Affiliated with

Also associated with

Rating

Method for testing semiconductor integrated circuit device, volt does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing semiconductor integrated circuit device, volt, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing semiconductor integrated circuit device, volt will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2430215