Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-01-06
1999-05-18
Brown, Glenn W.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, 257 48, G01R31/26
Patent
active
059053844
ABSTRACT:
An apparatus of testing a semiconductor element applies pulsed voltages synchronized with each other, respectively, to a gate and a drain of a semiconductor element being tested and measures current flowing through the semiconductor element in response to the pulsed voltages thus applied. The testing apparatus produces pulsed I-V characteristics considering the influences of self heating and surface energy levels of the semiconductor element and RF swing along a load line during large signal operation.
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Inoue Akira
Matsubayashi Hiroto
Nakajima Yasuharu
Ohta Yukio
Brown Glenn W.
Mitsubishi Denki & Kabushiki Kaisha
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