Method for testing semiconductor device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324765, 371 251, G01R 3128

Patent

active

054365597

ABSTRACT:
A method of testing a semiconductor device operating according to predetermined testing information. An output signal of the semiconductor device is received through a signal transmission line and a reference voltage is generated in accordance with an expected logical level of the output signal. The reference voltage is compared with a voltage of the output signal thus received and a current flow is supplied to the signal transmission line in accordance with the result. A logical level of the output signal thus received is determined and a decision is made whether the semiconductor device operates correctly.

REFERENCES:
patent: 3159787 (1964-12-01), Sexton et al.
patent: 3302109 (1967-01-01), Jones
patent: 3636443 (1972-01-01), Singh et al.
patent: 3982240 (1976-09-01), Waehner
patent: 4110698 (1978-08-01), Petrie
patent: 4637006 (1987-01-01), Bierhoff
patent: 4720671 (1988-01-01), Tada et al.
patent: 4908802 (1990-03-01), Harvey et al.
Takagi et al, "Improvement of Pulse Waveform on Transmission Line in High Speed LSI Testing", Institute of Electronics, Information Communication and Electric Engineers, 1989, pp. 51-58.
Barber et al, "Modern ATE", IEEE Design & Test, Apr. 1987, pp. 23-30.
David Royle, "Correct Signal Faults by Implementing Line-Analysis Theory", Designer's Guide to Transmission Lines & Interconnections, Part Two, 1988, pp. 143-148.
Barber et al, "Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads", IEEE 1986 International Test Conference, 1986, 161-186.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for testing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-742153

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.