Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-12
2009-02-10
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07489155
ABSTRACT:
A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
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Chen Ching-Too
Costello Michael Peter
Hopkins James E.
Tsai Herbert
Chroma Ate Inc
Lenkszus Donald J.
Patel Paresh
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