Method for testing OLED substrate and OLED display

Electric lamp and discharge devices: systems – Plural power supplies – Plural cathode and/or anode load device

Reexamination Certificate

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Details

C315S169100, C315S169200, C315S291000, C345S076000, C345S077000, C345S082000

Reexamination Certificate

active

07122970

ABSTRACT:
A method for testing an OLED substrate comprises: the first step of obtaining a first current value passing through a switching element group connected to a selection signal line; the second step of obtaining a second current value passing through a switching element group connected to a data signal line; and the third step of operating a current passing through each switching element including an OLED element from the current value for each pulse signal obtained by each of the steps 1 and 2.

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patent: 2005/0078057 (2005-04-01), Chang et al.
patent: 10-333641 (1998-12-01), None
patent: 2002-341825 (2002-11-01), None

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