Method for testing noise of thin-film magnetic head, and...

Electricity: measuring and testing – Magnetic – Magnetic information storage element testing

Reexamination Certificate

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C360S031000

Reexamination Certificate

active

08085038

ABSTRACT:
A noise-testing method for a thin-film magnetic head with an MR read head element and a heating unit capable of applying a heat and a stress to the MR read head element, includes a step of applying alternately and discontinuously with each other an electrical power having a first level and an electrical power having a second level higher than the first level to the heating unit, and a step of evaluating the thin-film magnetic head by measuring a noise output or noise outputs obtained from the MR read head element when the electrical power or the electrical powers are applied to the heating unit.

REFERENCES:
patent: 3863124 (1975-01-01), Pierce et al.
patent: 5991113 (1999-11-01), Meyer et al.
patent: 7274541 (2007-09-01), Oikawa et al.
patent: 7872471 (2011-01-01), Yamanaka et al.
patent: 06-084116 (1994-03-01), None
patent: 2002-133621 (2002-05-01), None
U.S. Appl. No. 11/835,049; Yamanaka et al.; filed Aug. 7, 2007; Title: “Testing Method of Head Element and Magnetic Reacording and Reproducing Apparatus Capable of Head Evaluating”.
U.S. Appl. No. 11/835,927; Yamanaka et al.; filed Aug. 8, 2007; Title: “Magmetic Reproducing Method for Suppressing Low Temperature Noise”.

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