Method for testing integrated devices

Details Method for testing integrated devices Method for testing integrated devices

1995-11-02

1997-04-01

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324115, G01R 104, G01R 3128

Patent

active

056170351

ABSTRACT:
An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).

REFERENCES:
patent: 4177417 (1979-12-01), Henry et al.
patent: 4637020 (1987-01-01), Schinabeck
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 5101153 (1992-03-01), Morong, III
patent: 5319305 (1994-06-01), Baba
Brooktree Corporation Product Bulletin, Bt648--Octal Pin Electronics Driver/Receiver, Feb. 1993, pp. 1-2.
Brooktree Corporation Product Advance Information document, Bt648--Octal Pin Electronics Driver/Receiver, Jan. 4, 1993, pp. 1-13.

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