Method for testing integrated circuit devices

Details Method for testing integrated circuit devices Method for testing integrated circuit devices

1992-10-16

1998-06-02

Tu, Trinh L.

Excavating

371 271, G01R 3128

Patent

active

057612145

ABSTRACT:
A method for testing integrated circuit devices and electronic devices. An integrated circuit device has one or more electronic devices, each having a channel of a particular length. In order to test an integrated circuit device or an individual electronic device, a voltage is applied to the device under test. The amount of voltage applied is a function of the channel lengths of the device being tested and, in particular, it is a function of the shortest channel lengths existing in the device being tested. This ensures that a safe voltage is applied to the device being tested.

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