Method for testing IDD at multiple voltages

Details Method for testing IDD at multiple voltages Method for testing IDD at multiple voltages

2006-04-04

2006-04-04

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07023230

ABSTRACT:
According to one embodiment, a method of testing an integrated circuit is provided. The quiescent current measuring of an integrated circuit is measured at two voltages. The functional relationship between the current measurements is determined and compared against a predetermined functional relationship to determine whether a defect exists in the integrated circuit.

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patent: 6590405 (2003-07-01), Okayasu
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