Method for testing electronic assemblies in the presence of nois

Details Method for testing electronic assemblies in the presence of nois Method for testing electronic assemblies in the presence of nois

1991-11-25

1994-07-05

Baker, Stephen M.

Excavating

364554, G01R 1700

Patent

active

053274377

ABSTRACT:
An iterative test method which is operable in the presence of measurement noise uses the result of a particular measurement on a device to decide whether to pass or fail the-device or to take another measurement. The pass/fail decision is made by computing certain statistical values which "compare" the measurement result to a predefined pass/fail limit. Another test measurement is made if the result of the present measurement is too "close" to the pass/fail limit to make an accurate decision. If the result is not too "close" to the limit then a pass/fail decision is made based on whether the measurement is on the pass or fail side of the limit. The statistical values used to compare the measurement value to the limit can be Z-statistics or Student-t statistics depending on the test environment and the noise characteristics. Overall feedback can be added to dynamically adjust the statistical values in order to bring overall error rates into alignment with predetermined error rate targets.

REFERENCES:
patent: 4782456 (1988-11-01), Poussier et al.
patent: 5130936 (1992-07-01), Sheppard

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