Coded data generation or conversion – Converter calibration or testing
Patent
1997-04-18
1999-11-02
Williams, Howard L.
Coded data generation or conversion
Converter calibration or testing
341172, 324677, H03M 110
Patent
active
059778938
ABSTRACT:
A test method for charge redistribution type digital-to-analog and analog-to-digital converters by utilizing the special characteristics of a DAC or ADC such that the accuracy and linearity of the converted signal is only determined by the internal capacitance ratios of the converter, and that the accuracy and linearity are not related to the test reference voltage, the test voltage and the noise signal of the test machine. The test method utilizes a principle of capacitance comparison to directly compare the capacitance ratios in a converter in order to determine the accuracy and linearity of the converted signal. The present invention method enables an effective reduction in the test time and test steps required and an increase in the test efficiency.
REFERENCES:
patent: 4129863 (1978-12-01), Gray et al.
patent: 4198622 (1980-04-01), Connolly, Jr. et al.
patent: 5654708 (1997-08-01), Boehl et al.
Chen Jason
Fan Henry
Holtek Semiconductor Inc.
Williams Howard L.
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