Method for testing characteristics of a semiconductor memory dev

Details Method for testing characteristics of a semiconductor memory dev Method for testing characteristics of a semiconductor memory dev

1993-11-22

1996-08-27

Nguyen, Hoa T.

Excavating

G01R 3128, G01R 3122

Patent

active

055508383

ABSTRACT:
Transfer data indicating a measurement status of a characteristics test of a semiconductor memory device is written into the semiconductor memory device itself in any one of a series of measurement steps. In the immediately following measurement step, the transfer data is read out, before performance of a characteristics test of this step, to judge the measurement status of the preceding measurement step. For example, the transfer data is data indicating that the characteristics test has been performed in the preceding step. Alternatively, it is classification data indicating a rank of the semiconductor memory device.

REFERENCES:
patent: 4363407 (1982-12-01), Bucker et al.
patent: 4651088 (1987-08-01), Sawada
patent: 4727318 (1988-02-01), Sakai et al.
patent: 5053698 (1991-10-01), Ueda
patent: 5062109 (1991-10-01), Ohshima et al.

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