Method for testing analog circuits

Details Method for testing analog circuits Method for testing analog circuits

2005-03-08

2005-03-08

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C324S765010

Reexamination Certificate

active

06865500

ABSTRACT:
The present disclosure relates to a method for testing a circuit having analog components. The method comprises performing a low-cost optimized test on the circuit by applying an optimized input stimulus to the circuit, capturing the circuit response to the input stimulus applied to the circuit, evaluating the circuit response to predict whether the performance parameters of the circuit satisfies predetermined specifications for the circuit, and making a pass/fail determination for the circuit based upon the evaluation of the circuit response.

REFERENCES:
patent: 4907230 (1990-03-01), Heller et al.
patent: 4935877 (1990-06-01), Koza
patent: 4991176 (1991-02-01), Dahbura et al.
patent: 5327437 (1994-07-01), Balzer
patent: 5341315 (1994-08-01), Niwa et al.
patent: 5506852 (1996-04-01), Chakradhar et al.
patent: 5748647 (1998-05-01), Bhattacharya et al.
patent: 5805795 (1998-09-01), Whitten
patent: 5819208 (1998-10-01), Carter
patent: 5859962 (1999-01-01), Tipon et al.
patent: 5910958 (1999-06-01), Jay et al.
patent: 6070258 (2000-05-01), Asaka
patent: 6631344 (2003-10-01), Kapur et al.

Affiliated with

Also associated with

Rating

Method for testing analog circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing analog circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing analog circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3416039