Method for testing analog and mixed-signal circuits using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07129734

ABSTRACT:
A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.

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Jin et al., “A Blind Identification Algorithm for Digital Calibration of Pipelined ADC”, IEEE Midwest Symposium on Circuits and Systems, Tulsa, Aug. 2002.
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Parthasarathy et al., “A Modified Histogram Approach for Accurate Self-Characterization of Analog-to-Digital Converters”, Proc. 2002 IEEE International Symposium on Circuits and Systems, Arizona, May 2002.
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Parthasarathy K. L., et al., “A histogram based AM-BIST algorithm for adc characterization using imprecise stimulus”, the 2002 45th Midwest Symposium on Circuits and Systems, Conference Proceedings, Tulsa OK, Aug. 4-7, 2002, Midwest Symposium on Circuits and Systems, New York, NY, vol. 1 of 3, Aug. 4, 2002, pp. 274-277, XP010635378.
Kuyel T., et al., “Optimal analog tri techniques for improving the linearity of pipeline ADCs”, Proceedings International Test Conference 2000 (nt. Test Conference, Washington, DC, Oct. 3, 2000, pp. 367-375, XP002300186.

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