Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1986-03-10
1996-07-16
Nguyen, Vinh P.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324769, 324765, G01R 3126, G01R 3102
Patent
active
055370543
ABSTRACT:
A testing method is provided for a semiconductor device which includes a control terminal and a pair of main terminals wherein one of the main terminals is isolated from the outside by a dielectric. First, a voltage which changes with time is applied to the isolated main terminal through the dielectric. A control signal which controls conduction and non-conduction of the semiconductor device is the applied to the control terminal. Following this, the test is made by detecting a displacement current flowing through at least one of the two main terminals and the control terminal.
REFERENCES:
patent: 3059183 (1962-10-01), McCallister
patent: 5377030 (1994-12-01), Suzuki et al.
Canard et al; "Voltage checking Device"; IBM Technical Disclosure Bulletin; vol. 8, No. 5; Oct. 1965; p. 806.
Garcia; "Voltage checking Device"; IBM Technical Disclosure Bulletin; vol. 8, No. 4; Sep. 1965.
Kawakami Hideaki
Kitazima Masaaki
Ohwada Jun-ichi
Suzuki Kenkichi
Suzuki Masayoshi
Hitachi , Ltd.
Nguyen Vinh P.
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