Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-30
2005-08-30
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06937048
ABSTRACT:
In previously known methods for testing internal signals of an integrated circuit, additional output pins were required which, in general, were linked to additional measuring pads within the integrated circuit.In the new method, the circuit functions are tested by using the output pins at which the output signal is present during normal operation of the integrated circuit. By means of a simple, external connection, with which a defined voltage value is set at the signal output, the integrated circuit is switched by means of an integrated control unit into a test mode in which it applies selected signals, which are to be tested, at the signal output. There is no need for additional internal measuring pads or additional output pins.
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Eichin Matthias
Kurz Alexander
Atmel Germany GmbH
Fasse W. F.
Fasse W. G.
Hollington Jermele
Vishay Semiconductor GmbH
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