Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-01-11
2005-01-11
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C324S1540PB, C702S082000, C714S718000, C714S736000
Reexamination Certificate
active
06842712
ABSTRACT:
A method tests an electronic component, especially a memory chip, which is connected to a computer system. Initially, test patterns and AC-/DC-parameters are read into the computer system. Then, the computer system generates an input test pattern for the electronic component. Afterwards, a simulation process is performed processing the input test pattern by the electronic component and measuring the current flowing in the electronic component. Ultimately, the method produces a statement concerning the functionality of the tested electronic component. Program instructions for causing a computer system to perform the above-described method for testing an electronic component can be stored in a computer program, a computer readable medium, a computer memory, a read-only memory, an electrical carrier signal, and a carrier, especially a data carrier. A computer system runs the computer program embodying the method.
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Barlow John
Greenberg Laurence A.
Infineon - Technologies AG
Le John
Locher Ralph E.
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