Method for testing an electric circuit

Details Method for testing an electric circuit Method for testing an electric circuit

2007-03-13

2007-03-13

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000

Reexamination Certificate

active

11214481

ABSTRACT:
In a method for testing an electric circuit, a first circuit is produced by a first process sequence. A first signal is applied to the first circuit and a signal indicating if the first circuit is defective is generated by comparing the first signal with the first circuit output signal. Then, a second circuit is produced by a second process sequence which includes incorporating at least one intentional defect structure. The first signal is applied to the second circuit and a signal is generated by comparing the first signal with the second circuit output in response to the first signal. A modified signal is applied to the second circuit, until a comparison of the modified signal and the respective response of the second circuit indicates a defective second circuit. Information about the modified signal resulting in the indication of a defective second circuit is stored.

REFERENCES:
patent: 5985497 (1999-11-01), Phan et al.
patent: 6546308 (2003-04-01), Takagi et al.
patent: 6617842 (2003-09-01), Nishikawa et al.
Martin et al., “FMEA Speeds Time to Market in Photonic IC Manufacturing”, Compound Semiconductor Magazine, Nov. 02 pp. 1-4, (4 pages).

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