Method for testing a TFT array

Details Method for testing a TFT array Method for testing a TFT array

2006-03-14

2006-03-14

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S1540PB

Reexamination Certificate

active

07012445

ABSTRACT:
A method for testing a TFT array that comprises one or a plurality of first pixels including capacitors connected to one terminal of pixel selection switches, one or a plurality of second pixels including capacitors connected to one terminal of pixel selection switches, and data lines connected to the other terminals of the pixel selection switches of the first pixels and the other terminals of the pixel selection switches of the second pixels, wherein the method for testing comprises a step for charging the capacitors of the first pixels to a first voltage, a step for charging the capacitors of the second pixels to a second voltage, a step for turning on both the pixel selection switches of the first pixels and the pixel selection switches of the second pixels, and a step for measuring either one or both of the voltage of a data line or the charge flowing through the data line.

REFERENCES:
patent: 5377030 (1994-12-01), Suzuki et al.
patent: 2004/0032278 (2004-02-01), Orii et al.
patent: 2005/0093567 (2005-05-01), Nara et al.
patent: 1 414 005 (2004-04-01), None
patent: 10-096754 (1998-04-01), None

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