Method for testing a semiconductor integrated circuit having sel

Details Method for testing a semiconductor integrated circuit having sel Method for testing a semiconductor integrated circuit having sel

1993-05-20

1994-10-11

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, G01R 1512

Patent

active

053550811

ABSTRACT:
A method is provided for testing a semiconductor integrated circuit including a main circuit, a self testing circuit for testing at least one part of the functions of the main circuit, and a test result output circuit having at least one light emitting device for outputting results from the self testing circuit in the form of light. The method includes the steps of inputting a test start to the self testing circuit so as to initiate operation of the self testing circuit; detecting light emitted from the light emitting device with an optical system, the light being emitted based on the test results from the self testing circuit; and obtaining the test results based on the light detection.

REFERENCES:
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 4978908 (1990-12-01), Mahant-Shetti et al.
patent: 5097206 (1992-03-01), Perner
patent: 5130645 (1992-07-01), Levy
patent: 5153503 (1992-10-01), Yahata
patent: 5159262 (1992-10-01), Rumbaugh et al.
T. Takeshima et al., "A 55-ns 16 Mb DRAM with Built-in Self-Test Function Using Microprogram ROM", IEEE Journal of Solid-State Circuits, vol. 25, No. 4, pp. 903-909 (Aug. 1990).
T. Takeshima et al., "A 55ns 16 Mb DRAM", from ISSCC Digest of Technical Papers, at pp. 246-247 (1989).
"2.3 Built-In Test", from Built-In Test for VLSI, Wiley-Interscience, at pp. 38-43.

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