Method for testing a remnant batch of semiconductor devices

Details Method for testing a remnant batch of semiconductor devices Method for testing a remnant batch of semiconductor devices

2005-07-26

2005-07-26

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

06922050

ABSTRACT:
A method for testing semiconductor devices includes loading a customer tray with semiconductor devices to be tested. Groups of devices are transferred from the customer tray to buffer trays for testing. The number of devices in the customer tray is checked after each transfer. If the customer tray is empty, the number of semiconductor devices in the buffer trays is counted and compared with the number of semiconductor devices that can be tested simultaneously, typically either 64 or 128. If the number of semiconductor devices in the buffer trays is greater than the tester capacity, the semiconductor devices in at least one buffer tray are tested. If the number of semiconductor devices in the buffer trays is smaller than the tester capacity, semiconductor devices that were determined to be low quality in a prior test are loaded into a buffer tray, thus testing both untested and low quality devices together.

REFERENCES:
patent: 5307011 (1994-04-01), Tani
patent: 6163146 (2000-12-01), Suzuki et al.
patent: 6384593 (2002-05-01), Kobayashi et al.
patent: 6728652 (2004-04-01), Kobayashi

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