Method for testing a plurality of devices disposed on a...

Details Method for testing a plurality of devices disposed on a... Method for testing a plurality of devices disposed on a...

2005-07-12

2005-07-12

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06917214

ABSTRACT:
In a method for testing a plurality of devices, which are arranged on a wafer and connected to a common data line, wherein the devices are connectable to a test unit via the common data line, a connection is separated first between a defective device and the common data line, or an internal connection in the defective device is separated. Subsequently, the remaining devices are tested. Alternatively, instead of the connection between the defective device and the common data line, the connection between a defective device and a common or an individual supply line is separated.

REFERENCES:
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patent: 5389556 (1995-02-01), Rostoker et al.
patent: 5446310 (1995-08-01), Baliga et al.
patent: 44 00 118 (1995-07-01), None
patent: 197 07 312 (1998-08-01), None
patent: 0 494 782 (1992-07-01), None

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