Method for testing a memory device and memory device for...

Details Method for testing a memory device and memory device for... Method for testing a memory device and memory device for...

2007-05-15

2007-05-15

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11204739

ABSTRACT:
A memory device for data storage has a memory module with at least one memory bank in which data are stored and from which the stored data are read out, and a logic unit for controlling a writing and a reading of data to and from the at least one memory bank. Furthermore, a test module for testing the functionality of the memory module is provided. The test module is arranged in a manner separated from the memory module in a separate circuit unit, and is connected to the memory module via a communication device for the exchange of communication signals

REFERENCES:
patent: 6539505 (2003-03-01), Dahn
patent: 6754117 (2004-06-01), Jeddeloh
patent: 6968483 (2005-11-01), Hartmann
patent: 2003/0120974 (2003-06-01), Adams et al.
patent: 2005/0108609 (2005-05-01), Thalmann
patent: 2006/0064261 (2006-03-01), Boldt
patent: 2006/0232425 (2006-10-01), Ueno
patent: 1 434 370 (2004-06-01), None
patent: WO 04/017162 (2004-02-01), None

Affiliated with

Also associated with

Rating

Method for testing a memory device and memory device for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing a memory device and memory device for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing a memory device and memory device for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3770293