Method for testing a high-speed digital to analog converter...

Details Method for testing a high-speed digital to analog converter... Method for testing a high-speed digital to analog converter...

2010-03-19

2011-11-01

Jeanglaude, Jean (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S155000, C341S118000

Reexamination Certificate

active

08049650

ABSTRACT:
A method for testing a digital to analog converter, which operates in an undersampling environment, wherein signals of a tested DAC and a signal generator are modulated by a PWM device and then processed by a digital processing circuit to generate a digital signal, whereby is formed a low-speed equivalent ADC. The signal generator is provided by uniform-distribution random test patterns, and the signal generator generates an uniform-distribution random analog signal to the equivalent ADC. Thereby, the test error caused by the non-ideality of the signal generator is corrected, and the tested circuit can work in a full speed.

REFERENCES:
patent: 6642869 (2003-11-01), Kuyel et al.
patent: 6651023 (2003-11-01), Mori et al.
patent: 7110739 (2006-09-01), Braithwaite
patent: 7355537 (2008-04-01), Lin

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