Method for testing a contact region of a semiconductor module

Details Method for testing a contact region of a semiconductor module Method for testing a contact region of a semiconductor module

2007-09-04

2007-09-04

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11233348

ABSTRACT:
A method for testing a contact region of a semiconductor module having a circuit arrangement is disclosed. In one embodiment, the semiconductor module is heated by an electrical heating current flow and the electrical and/or thermal quality of a plurality of contacts provided in the contact region is determined in the process from a temperature-dependent measurement quantity. The heating current flow is formed by a plurality of heating current pulses. The application of the heating current pulses leads to different phases of the measurement quantity. The different phases are assigned to the different contacts and evaluated correspondingly for determining the electrical and/or thermal quality of the contacts.

REFERENCES:
patent: 5568055 (1996-10-01), Olsen
patent: 6909271 (2005-06-01), Sloneker et al.
patent: 19726534 (1998-12-01), None
patent: 19824064 (1999-12-01), None

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