Method for test of electronic component

Details Method for test of electronic component Method for test of electronic component

2007-10-09

2007-10-09

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11409771

ABSTRACT:
A method for testing an electronic component. The method includes connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial including multiple tests specified as proof of low-to-high transition or as high-to-low transition; computing values for initial trial parameters; if low-to-high transition edge not found: executing a low-to-high trial and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found.

REFERENCES:
patent: 5586125 (1996-12-01), Warner
patent: 6571185 (2003-05-01), Gauland et al.
patent: 6865500 (2005-03-01), Variyam et al.
patent: 2003/0225562 (2003-12-01), Singh

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