X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1984-03-19
1987-03-24
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
2503591, 209576, 209589, 378 49, G01N 23223, G01F 2300, B07C 500
Patent
active
046530819
ABSTRACT:
According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I.sub.1 is measured, as well as the respective intensity I.sub.2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I.sub.1 and I.sub.2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.
REFERENCES:
patent: 3404275 (1968-10-01), Martinelli
patent: 3655964 (1972-04-01), Slight
patent: 4121098 (1978-10-01), Jagoutz et al.
Bertin, Eugene, "Standardization with Scattered X-rays", Intro. to X-ray Spectrometric Analysis, pp. 344-348, 224-226, .COPYRGT.1978.
Laamanen Kai J.
Sipila Heikki J.
Church Craig E.
Outokumpu Oy
Wieland Charles F.
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