Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2005-08-16
2005-08-16
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
06930780
ABSTRACT:
A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s1, . . . , snof the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sdseparated by at least one respective intermediate way point si, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points siupon a second or further repeated displacement over the distance s.
REFERENCES:
patent: 4538910 (1985-09-01), Doyle
patent: 4544272 (1985-10-01), Doyle
patent: 5245406 (1993-09-01), Masutani
patent: 5422721 (1995-06-01), Ryan
patent: 5539518 (1996-07-01), Bennett
patent: 5835213 (1998-11-01), Curbelo
patent: 199 40 981 (2001-07-01), None
patent: WO 01/06209 (2001-01-01), None
Rapp Norbert
Simon Arno
Bruker Optik GmbH
Lyons Michael A.
Toatley , Jr. Gregory J.
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