Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2003-02-26
2004-05-18
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S178000, C374S163000, C327S572000
Reexamination Certificate
active
06736540
ABSTRACT:
FIELD OF THE INVENTION
The invention relates to a method for chip temperature measurement and, in particular, to a method for synchronously measuring a delta-VBE (&Dgr;V
BE
) voltage of an on-chip diode to calculate the chip temperature.
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Sheehan Gary E.
Wan Jun
Cook Carmen C.
National Semiconductor Corporation
Patent Law Group LLP
Verbitsky Gail
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