Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
C324S623000
Reexamination Certificate
active
06909292
ABSTRACT:
A method for calibrating a low pass filter is disclosed. The low pass filter comprises a plurality of transconductor cells. The method comprises generating a test signal to the low pass filter and suppressing even-order harmonics due to transistor mismatches within the plurality of transconductor cells. By adding a small number of transistors, the mismatch-induced even order harmonics can be greatly reduced. Even-order harmonics are minimized through the application of a control voltage. A method for calibrating against transistor mismatch utilizing a CMOS transconductor that is based on the regulated cascode topology is disclosed. The method is designed to provide suppression of the even-order harmonics, a very small increase in power and a silicon area of the transconductor cell. A well-defined offset is provided by biasing one of the mismatched transistors.
REFERENCES:
patent: 4344029 (1982-08-01), Cabot et al.
patent: 6137370 (2000-10-01), Yamamoto
patent: 2001/0005151 (2001-06-01), Suematsu et al.
patent: 2002/0160740 (2002-10-01), Hatcher et al.
Athena Semiconductors, Inc.
Nguyen Vincent Q.
Sawyer Law Group LLP
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