Induced nuclear reactions: processes – systems – and elements – Nuclear transmutation – Gamma or charged particle activation analysis
Patent
1996-08-08
1999-02-16
Behrend, Harvey E.
Induced nuclear reactions: processes, systems, and elements
Nuclear transmutation
Gamma or charged particle activation analysis
250283, G21G 108, B01D 5944
Patent
active
058728244
ABSTRACT:
A heavy ion generator is used with a plasma desorption mass spectrometer to provide an appropriate neutron flux in the direction of a fissionable material in order to desorb and ionize large molecules from the material for mass analysis.
The heavy ion generator comprises a fissionable material having a high n,f reaction cross section. The heavy ion generator also comprises a pulsed neutron generator that is used to bombard the fissionable material with pulses of neutrons, thereby causing heavy ions to be emitted from the fissionable material. These heavy ions impinge on a material, thereby causing ions to desorb off that material. The ions desorbed off the material pass through a time-of-flight mass analyzer, wherein ions can be measured with masses greater than 25,000 amu.
REFERENCES:
patent: 3031394 (1962-04-01), McCorkle et al.
patent: 3291694 (1966-12-01), Borst
patent: 3423844 (1969-01-01), Mittelman
patent: 3496357 (1970-02-01), Weinzierl et al.
patent: 3976888 (1976-08-01), Miller et al.
patent: 4240844 (1980-12-01), Felice et al.
patent: 4300054 (1981-11-01), Dance et al.
patent: 4314155 (1982-02-01), Sowerby
patent: 4490610 (1984-12-01), Ulbricht, Jr.
patent: 4578237 (1986-03-01), Mordasski et al.
patent: 4634568 (1987-01-01), Wimpee et al.
patent: 4694168 (1987-09-01), Beyec et al.
patent: 4830813 (1989-05-01), Dance (II)
patent: 4835383 (1989-05-01), Mahoney et al.
patent: 4857259 (1989-08-01), Bartko et al.
patent: 4938916 (1990-07-01), Dance (I)
patent: 5002720 (1991-03-01), Berggren
patent: 5078951 (1992-01-01), August, Jr.
patent: 5135704 (1992-08-01), Shefer et al.
patent: 5148021 (1992-09-01), Okamoto et al.
patent: 5232711 (1993-08-01), Sanderson et al.
patent: 5360976 (1994-11-01), Young et al.
Macfarlane, 252 Cf-Plasma desorption mass spectrometry using polymer surfaces, published in "Trends in Analytical Chemistry", vol. 7, No.5, 1988, pp. 179-183.
Cotter, Plasma Desorption Mass Spectrometry: Coming of Age, pp.781A, 782A, 784A, 786A, 788A, 789A, 791A 793A. published in "Analytical Chemistry", vol. 60, No. 13, Jul. 1, 1988.
Nuclear Technology, vol. 10, (Mar. 1971), pp. 365-379, Menlove et al.
Kerntechnik, vol. 17, No. 1, (1975), pp. 36-41.
Browning James F.
Fries David P.
Behrend Harvey E.
Gottlieb Paul A.
McMillan Armand
Moser William R.
The United States of America as represented by The United States
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