Method for studying a sample and optical interferometer for...

Details Method for studying a sample and optical interferometer for... Method for studying a sample and optical interferometer for...

2006-01-31

2006-01-31

Lee, Hwa (Department: 2877)

Optics: measuring and testing

By light interference

Using fiber or waveguide interferometer

C356S497000

Reexamination Certificate

active

06992776

ABSTRACT:
The present invention relates to the study of internal structure of objects by optical means. The invention presents a bi-directional sampling optical path for the low coherent optical radiation directed to the sample, i.e. a bi-directional sampling arm, and two unidirectional reference beams directed along a reference path designed as a loop. One of the reference beams propagates clockwise and the other propagates counterclockwise in the reference loop. The beam splitters non-reciprocal or polarization-dependent and by placing polarization-changing elements between the beam splitters and/or into the sampling arm and the reference loop. Thus the developed method and optical interferometer make possible to ensure highly efficient use of optical source power together with optimal signal-to-noise ratio for a given optical source power and are simple and cost effective.

REFERENCES:
patent: 5268738 (1993-12-01), Baney et al.
patent: 5291267 (1994-03-01), Sorin et al.
patent: 5975697 (1999-11-01), Podoleanu et al.
patent: 6201608 (2001-03-01), Mandella et al.
patent: 6680779 (2004-01-01), Toida
patent: WO 03/069272 (2003-08-01), None
International Search Report dated May 20, 2003 related to PCT/RU 03/00041.

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