Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Reexamination Certificate
2004-12-15
2008-11-25
Parker, Frederick J (Department: 1792)
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
C427S008000, C427S475000, C427S427200
Reexamination Certificate
active
07455878
ABSTRACT:
An apparatus and method for simultaneously coating and measuring a part including a part support, a sprayer, a part measurer including a digital camera and a display device, all of which are positioned adjacent to the part support. The sprayer applies a coating to a section of the part while the part measurer continuously measures at least two dimensions of the section. The digital camera takes at least one picture of the entire section of the part while the part is being coated and enables a user to accurately determine the cross section of the part to the optimum finished part configuration and size and also detect defects, blemishes or coating irregularities formed on the section. The apparatus and method of the present invention significantly reduces the margin of error related to the application of coatings to parts, the number of defective parts and increases the overall efficiency.
REFERENCES:
patent: 2048912 (1936-07-01), Ziska et al.
patent: 3645581 (1972-02-01), Lasch, Jr. et al.
patent: 4346667 (1982-08-01), Stamets et al.
patent: 4800104 (1989-01-01), Cruickshank
patent: 4895102 (1990-01-01), Kachel et al.
patent: 4957526 (1990-09-01), Frazee et al.
patent: 5001353 (1991-03-01), Odake et al.
patent: 5138972 (1992-08-01), Glanzmann
patent: 5229840 (1993-07-01), Arnarson et al.
patent: 5274243 (1993-12-01), Hochgraf
patent: 5277928 (1994-01-01), Strandberg
patent: 5366757 (1994-11-01), Lin
patent: 5374312 (1994-12-01), Hasebe et al.
patent: 5375613 (1994-12-01), Aindow et al.
patent: 5429682 (1995-07-01), Harlow et al.
patent: 5666325 (1997-09-01), Belser et al.
patent: 5709905 (1998-01-01), Shaw et al.
patent: 5757498 (1998-05-01), Klein, II et al.
patent: 5759615 (1998-06-01), Lasley et al.
patent: 5871805 (1999-02-01), Lemelson
patent: 5902399 (1999-05-01), Courtenay
patent: 5959731 (1999-09-01), Jones
patent: 6169605 (2001-01-01), Penn et al.
patent: 6236459 (2001-05-01), Negahdaripour et al.
patent: 6270579 (2001-08-01), Subramanian et al.
patent: 6279226 (2001-08-01), Ohkubo et al.
patent: 6376013 (2002-04-01), Rangarajan et al.
patent: 6388754 (2002-05-01), Nishikawa et al.
patent: 6421929 (2002-07-01), Keefe
patent: 6423371 (2002-07-01), Nesbitt
patent: 6459951 (2002-10-01), Griffith et al.
patent: 6496222 (2002-12-01), Roberts et al.
patent: 6548115 (2003-04-01), Gibson et al.
patent: 6549291 (2003-04-01), Dieter et al.
patent: 6667070 (2003-12-01), Adem
patent: 6699324 (2004-03-01), Berdin et al.
patent: 2003/0161946 (2003-08-01), Moore et al.
patent: 2004/0003776 (2004-01-01), Nesbitt
patent: 2004/0005402 (2004-01-01), Nesbitt
patent: 04077712 (1992-03-01), None
Keyence, High-speed Laser Scan Micrometer, Cat. No. LS5-C (1999).
NN75022703, Article Transfer/ Cleaning/ Inspection Station, Feb. 1975, IBM Technical Disclosure Bulletin, Disclosure Text and Figure (cited by Examiner in co-pending U.S. Appl. No. 11/301,489).
Bell Boyd & Lloyd LLP
Dimension Bond Corporation
Parker Frederick J
LandOfFree
Method for simultaneously coating and measuring parts does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for simultaneously coating and measuring parts, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for simultaneously coating and measuring parts will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4040005