Method for simulation with optimized kernels and debugging...

Details Method for simulation with optimized kernels and debugging... Method for simulation with optimized kernels and debugging...

2008-09-09

2008-09-09

Rodriguez, Paul L (Department: 2123)

Data processing: structural design, modeling, simulation, and em

Simulating electronic device or electrical system

Circuit simulation

C703S013000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

10751307

ABSTRACT:
A method for providing verification for a first simulation image involves removing nodes from the first simulation image to produce an optimized image and an optimized nodes image, simulating the optimized image, invoking the optimized nodes image if debugging is selected, reconstructing a second simulation image using the optimized image and the optimized nodes image, simulating the second simulation image to gather simulation data, and debugging the first simulation image using simulation data.

REFERENCES:
patent: 6009256 (1999-12-01), Tseng et al.
patent: 6088821 (2000-07-01), Moriguchi et al.
patent: 6108494 (2000-08-01), Eisenhofer et al.
patent: 6496972 (2002-12-01), Segal
patent: 6510541 (2003-01-01), Fujiwara et al.
patent: 6785873 (2004-08-01), Tseng

Affiliated with

Also associated with

Rating

Method for simulation with optimized kernels and debugging... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for simulation with optimized kernels and debugging..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for simulation with optimized kernels and debugging... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3905780