Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-10-30
2007-10-30
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S549000
Reexamination Certificate
active
11316011
ABSTRACT:
A method for characterizing the current as a function of applied electric field for a resistor exposed to a high electric fields is described. The method uses current versus voltage measurements at low electric fields, where the resistor is not damaged and the current does not saturate. An example illustrating the importance of such resistor characterization is provided.
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patent: 5585731 (1996-12-01), Tsuchida et al.
patent: 5889663 (1999-03-01), Tabata et al.
patent: 6242928 (2001-06-01), Honda
Fukumoto Jay T.
Paradis Kenneth J.
Park Sangjune
Cochran Freund & Young LLC
LSI Corporation
Nguyen Hoai-An D.
Nguyen Vincent Q.
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