Method for simulating a system having multiple failure modes

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C703S002000, C703S007000, C703S013000, C700S030000, C700S031000, C700S051000

Reexamination Certificate

active

07571089

ABSTRACT:
A method is described for determining the effectiveness of maintenance or other improvements to a system having multiple sections and multiple modes of failure. The method uses a simulation model that is dynamic in that it can change during a simulation run to show how a system event such as a failure of one system section can effect a different system section. By running the simulation model multiple times, it may become apparent which system section will benefit most from maintenance or other improvements.

REFERENCES:
patent: 6901308 (2005-05-01), Hamada et al.
patent: WO 01/84254 (2001-11-01), None
patent: WO 01/84315 (2001-11-01), None
patent: WO 01/84468 (2001-11-01), None
patent: WO 2004/095340 (2004-11-01), None
“Making Everyday Life a Little Better,” P&G PowerPoint presentation, 2004, 38 pages.
Ayala, F. Javier, “Reliability Knowledge—Improving, Sustaining, & Designing ‘Highly’ Efficient Production Systems,” P&G PowerPoint presentation, ARC Forum, Jul. 2006, pp. 1-22.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for simulating a system having multiple failure modes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for simulating a system having multiple failure modes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for simulating a system having multiple failure modes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4111161

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.