Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1996-06-07
1997-11-18
Brown, Glenn W.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324602, 324603, 342170, G01R 2728
Patent
active
056891920
ABSTRACT:
Apparatus and method for low cost monitoring the level of signal at a test point in a system for susceptibility to electromagnetic fields. A probe, including a detector diode, and a non-metallic, electrically overdamped conductor, which is transparent to the electromagnetic field, is used to monitor the signal level at a test point as an amplitude modulated radio frequency carrier. The carrier is transmitted to a monitor outside of the range of the electromagnetic field using a transmission link, such as an optical waveguide transmitter, that is transparent to the electromagnetic field when the system under test fails. The system under test can then be removed from the electromagnetic field and, for each frequency at which the system failed, a voltage can be injected, using a voltage injection probe, into the system at another point to recreate the detected level of signal at the test point that was coupled into the system from the electromagnetic field. This simulates the effect of the susceptibility to the electromagnetic field, and permits testing of a suitable filter or other expedient applied to the system, even though the system is not exposed to the electromagnetic field. Thus, the system may be tested for susceptibility inside a shielded enclosure and subjected to a controlled electromagnetic field, and the susceptibility may be recreated and solved outside of the shielded enclosure. The probe may include a plurality of detector diodes mounted on a printed circuit board in a shielded structure that is directly connected to the test wire of the circuit to be monitored.
REFERENCES:
patent: 3737708 (1973-06-01), Ari et al.
patent: 3743925 (1973-07-01), Bossi
patent: 3991397 (1976-11-01), King
patent: 4255750 (1981-03-01), Riley
patent: 4328461 (1982-05-01), Butters et al.
patent: 4365192 (1982-12-01), Rankin et al.
patent: 4425542 (1984-01-01), Tsaliovich et al.
patent: 4471348 (1984-09-01), London et al.
patent: 4510468 (1985-04-01), Mayer
patent: 4521780 (1985-06-01), Preikschat
patent: 4647844 (1987-03-01), Biegon et al.
patent: 4704596 (1987-11-01), Coffey et al.
patent: 4839586 (1989-06-01), Musseau et al.
patent: 4845378 (1989-07-01), Garbe et al.
patent: 4939446 (1990-07-01), Rogers
patent: 4962358 (1990-10-01), Svetanoff
patent: 4973911 (1990-11-01), Marshall
patent: 4977376 (1990-12-01), Shiek et al.
patent: 4989260 (1991-01-01), Meade
patent: 5006788 (1991-04-01), Goulette
patent: 5068616 (1991-11-01), Broyde et al.
patent: 5237283 (1993-08-01), Carbonini
patent: 5311116 (1994-05-01), Rogers
patent: 5406209 (1995-04-01), Johnson et al.
patent: 5414345 (1995-05-01), Rogers
patent: 5414366 (1995-05-01), Rogers
patent: 5514971 (1996-05-01), Hankui et al.
Knowles et al., "Cable Shielding Effectiveness Testing," IEE Trans. on Electromagnetic Compatibility, 1974, vol. EMC-16, No. 1, pp. 16-23. (month unavailable).
Preliminary Product Bulletin for Flurosint.RTM. 719 Insulated Monofilament and Flurosint.RTM. 819 Dual Line, by the Polymer Corporation. (undated).
Gary F.E. Vrooman, "Vehicle Level EMC Testing Methodology," Ford Motor Company, Jan. 1988.
Bulletin for AITECH Current Probes, Eaton Advanced Electronic, Nov. 1981.
Product Literature, Broadband Isotropic Probe Systems, EMCO, Jan. 1990.
Product Literature, Model 5188 and Model 3718 Micrograbber Test clips, ITT Pomona Electronics, Jan. 1989.
Frank M. Greene, "A New Near-Zone Electric-Field-Strength Meter," Journal of Research, vol. 71C, No. 1, Jan.-Mar. 1967.
G.A. Jackson, "Survey of EMC Measurement Techniques", Electronics and Communications Engineering Journal, I., Mar./Apr. 1989, No. 2, pp. 61-70.
Ir. G.A. van der Pijl, "Methoden voor hoogfrequent-tests", 825 PT Elektronica-Elektrotechniek, 45 (1990) Apr., No. 4, Rijswijk, NL.
H. Birkner, et al., "Elektrotechnik und Informationstechnik", 8038 E&I Elektrotechnik and Informationstechnik 108 (1991) No. 9, Wien, AT, pp. 285-399. (month available).
Brown Glenn W.
Electronic Development Inc.
LandOfFree
Method for simulating a controlled voltage for testing circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for simulating a controlled voltage for testing circuits , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for simulating a controlled voltage for testing circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1568520