Method for shortening the statistical measurement times in...

Details Method for shortening the statistical measurement times in... Method for shortening the statistical measurement times in...

2005-07-26

2005-07-26

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

C250S366000

Reexamination Certificate

active

06922654

ABSTRACT:
Method for the detection of an exceeding of a predetermined limiting value in a radioactivity measurement. A total duration of measurement for a contamination measuring device is calculated. Several single measurements are performed with the measuring device, with duration of measurement shorter than the total duration of measurement. After each single measurement, a probability is calculated on the basis of the previously measured measurement values. If the calculated probability is smaller than or equal to the limiting value, a signal is generated and the procedure is ended. Otherwise, further single measurements are performed.

REFERENCES:
patent: 3670164 (1972-06-01), Hardy et al.
patent: 5987483 (1999-11-01), Edelkind et al.
patent: 6360183 (2002-03-01), Shilton
patent: 42 40 535 (1994-01-01), None

Affiliated with

Also associated with

Rating

Method for shortening the statistical measurement times in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for shortening the statistical measurement times in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for shortening the statistical measurement times in... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3417950