Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-10-20
1995-08-22
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055922, G01B 1124
Patent
active
054445370
ABSTRACT:
A shape detecting arrangement allows a shape of an object to be very precisely detected at a high resolution, by projecting a plurality of light beams in mutually different ways onto an identical spot of the object substantially in an identical direction, forming on a position detector images of beams of the projected beams reflected back from the object, obtaining a ratio of intensity of the reflected beams by virtue of outputs from the position detector, obtaining positions of the respective reflected beams by virtue of variation component of the ratio of intensity with respect to a reference plane for detecting the position of the object, and finally obtaining height displacement of the respective positions obtained with respect to the reference plane on the basis of the positions and angles of incidence of the reflected beams into the position detector.
REFERENCES:
patent: 4088048 (1978-05-01), Burcher et al.
patent: 4443706 (1984-04-01), Di Matteo et al.
Nakamura Kuninori
Yoshimura Kazunari
Evans F. L.
Matsushita Electric & Works Ltd.
LandOfFree
Method for shape detection and apparatus therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for shape detection and apparatus therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for shape detection and apparatus therefor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2145856