Method for severing brittle material substrate and severing...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing

Reexamination Certificate

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Details

C438S068000, C438S113000, C438S115000, C438S458000, C438S460000

Reexamination Certificate

active

07851241

ABSTRACT:
There are provided a scribing step of performing scribing in a state in which a protective material is applied on at least one surface of a brittle material substrate, and a first scribing device that performs this scribing step. Accordingly, it is possible to form a vertical crack that reaches deep inside of the substrate, while effectively removing cullets produced at the time of severing the substrate, thus performing precise severing along a scribe line.

REFERENCES:
patent: 4275494 (1981-06-01), Kohyama et al.
patent: 4306351 (1981-12-01), Ohsaka et al.
patent: 5238876 (1993-08-01), Takeuchi et al.
patent: 5836229 (1998-11-01), Wakayama et al.
patent: 6121118 (2000-09-01), Jin et al.
patent: 6461940 (2002-10-01), Hasegawa et al.
patent: 6465329 (2002-10-01), Glenn
patent: 6521513 (2003-02-01), Lebens et al.
patent: 6908784 (2005-06-01), Farnworth et al.
patent: 2001/0001215 (2001-05-01), Siniaguine et al.
patent: 2002/0031864 (2002-03-01), Ball
patent: 2002/0115235 (2002-08-01), Sawada
patent: 21 45 552 (1972-10-01), None
patent: 356067933 (1981-06-01), None
patent: 5-297334 (1993-11-01), None
patent: 06-183765 (1994-07-01), None
patent: 07-201787 (1995-08-01), None
patent: 08-325027 (1996-12-01), None
patent: 09-017756 (1997-01-01), None
patent: 10-020291 (1998-01-01), None
patent: 11-116260 (1999-04-01), None
patent: 2000-124159 (2000-04-01), None
patent: 02000150426 (2000-05-01), None
patent: 2000-219527 (2000-08-01), None
patent: 2002-182185 (2002-06-01), None
Supplementary European Search Report for the Application No. EP 03 71 5694 dated Dec. 21, 2007.
International Search Report for PCT/JP03/04159 mailed on Jul. 22, 2003.
International Preliminary Examination Report for PCT/JP03/04159 completed on Jul. 1, 2004.

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