Method for setting the threshold voltage of a reference memory c

Static information storage and retrieval – Floating gate – Particular biasing

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36518524, G11C 1134

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active

057843147

ABSTRACT:
A method for setting the threshold voltage of a reference memory cell of a memory device is described, the reference memory cell being used as a reference current generator for generating a reference current which is compared by a sensing circuit of the memory device with currents sunk by memory cells to be sensed, belonging to a memory matrix of the memory device. The method comprises a first step in which the reference memory cell is submitted to a change in its threshold voltage, and a second step in which the threshold voltage of the reference memory cell is verified. The second step provides for performing a sensing of the reference memory cell using a memory cell with known threshold voltage belonging to the memory matrix as a reference current generator for generating a current which is compared by the sensing circuit with the current sunk by the reference memory cell.

REFERENCES:
patent: 5077691 (1991-12-01), Haddad et al.
patent: 5386388 (1995-01-01), Atwood et al.
patent: 5444656 (1995-08-01), Bauer et al.
patent: 5481494 (1996-01-01), Tang et al.

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